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Hlavní stránka>UNE EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
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sklademVydáno: 2006-11-01
UNE EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)

UNE EN 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 39: Medida de la difusividad de la humedad y solubilidad en agua en materiales orgánicos para componentes semiconductores (IEC 60749-39:2006). (Ratificada por AENOR en noviembre de 2006.)

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1 390 Kč
Označení normy:UNE EN 60749-39:2006
Počet stran:13
Vydáno:2006-11-01
Status:Norma
Popis

This standard UNE EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.) is classified in these ICS categories:

  • 31.080.01
:
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