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sklademVydáno: 2019-10-17
19/30404655 DC
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Měna
| Označení normy: | 19/30404655 DC |
| Počet stran: | 23 |
| Vydáno: | 2019-10-17 |
| Status: | Draft for Comment |
Popis
19/30404655 DC
This standard 19/30404655 DC BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
- 31.080.99 Other semiconductor devices