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Homepage>BSI Standards>31 ELEKTRONIKA>31.080 Polovodičové součástky>31.080.01 Polovodičové součástky obecně

31.080.01 Polovodičové součástky obecně

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170 results
First page123...8910111214Last page
13/30290462 DC
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
Vydáno: 2013-09-10
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22/30451588 DC
BS EN 63150-3 Ed.1.0. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Part 3. Human foot impact motion
Vydáno: 2022-03-29
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BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Vydáno: 2022-07-19
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Vydáno: 2023-04-05
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23/30478757 DC
BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability qualification plans for power semiconductor module
Vydáno: 2023-08-17
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BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-12-20
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24/30502824 DC
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
Vydáno: 2024-12-13
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25/30509883 DC
Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock
Vydáno: 2025-02-06
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25/30513132 DC
BS EN IEC 63068-5 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 5: Test method for defects using X-ray topography
Vydáno: 2025-03-14
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25/30512405 DC
Draft BS EN 61582 Ed.2.0 Radiation protection instrumentation - Portable, transportable or installed equipment for in vivo measurement of photon emitting radionuclides
Vydáno: 2025-04-09
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25/30510639 DC
Draft BS EN 63567-4 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 4. Evaluation methods for dimensional accuracy of laser dicing process
Vydáno: 2025-06-20
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BS IEC 60747-5-4:2022 - TC
Tracked Changes. Semiconductor devices Optoelectronic devices. Semiconductor lasers
Vydáno: 2023-10-31
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170 results
First page123...8910111214Last page