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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Vydáno: 2020-07-21
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BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Vydáno: 2003-06-19
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BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Vydáno: 2003-07-07
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BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Vydáno: 2016-06-30
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BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Vydáno: 1991-02-28
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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Vydáno: 2017-11-27
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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Vydáno: 2010-01-31
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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Vydáno: 2011-09-30
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