PRICES include / exclude VAT
31.080.01 Polovodičové součástky obecně
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Vydáno: 2017-11-28
Anglicky Secure PDF
Immediate download
192.25 €
Anglicky Hardcopy
In stock
192.25 €
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Vydáno: 2008-06-30
Anglicky Secure PDF
Immediate download
192.25 €
Anglicky Hardcopy
In stock
192.25 €
Anglicky Secure PDF
Immediate download
192.25 €
Anglicky Hardcopy
In stock
192.25 €
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Vydáno: 2011-07-31
Anglicky Secure PDF
Immediate download
313.93 €
Anglicky Hardcopy
In stock
313.93 €
Anglicky Secure PDF
Immediate download
313.93 €
Anglicky Hardcopy
In stock
313.93 €
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Vydáno: 1990-03-30
Anglicky Secure PDF
Immediate download
401.54 €
Anglicky Hardcopy
In stock
401.54 €
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Vydáno: 2017-11-24
Anglicky Secure PDF
Immediate download
163.05 €
Anglicky Hardcopy
In stock
163.05 €
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Vydáno: 2011-09-30
Anglicky Secure PDF
Immediate download
267.69 €
Anglicky Hardcopy
In stock
267.69 €
BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Vydáno: 2010-04-30
Anglicky Secure PDF
Immediate download
192.25 €
Anglicky Hardcopy
In stock
192.25 €
Anglicky Secure PDF
Immediate download
523.22 €
Anglicky Hardcopy
In stock
523.22 €
BS IEC 62779-4:2020
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Vydáno: 2020-07-17
Anglicky Secure PDF
Immediate download
192.25 €
Anglicky Hardcopy
In stock
192.25 €
Anglicky Secure PDF
Immediate download
267.69 €
Anglicky Hardcopy
In stock
267.69 €