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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Vydáno: 2008-06-30
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BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Vydáno: 2011-07-31
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BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Vydáno: 1990-03-30
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Vydáno: 2017-11-24
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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Vydáno: 2011-09-30
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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Vydáno: 2011-06-30
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PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Vydáno: 2001-07-15
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PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Vydáno: 2001-03-15
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BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Vydáno: 2010-04-30
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