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sklademVydáno: 2026-08-28
IEC 63287-4:2026
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
Dispositifs à semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilité - Partie 4: Évaluation des défaillances précoces
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| Označení normy: | IEC 63287-4:2026 |
| Vydáno: | 2026-08-28 |
| Edice: | 1 |
| ICS: | 31.080.01 |
| Počet stran (Anglicky): | 15 |
| ISBN (Anglicky): | 9782832714614 |
Popis
IEC 63287-4:2026
IEC 63287-4:2026 gives guidelines for the development of reliability qualification plans using the early failure assessment, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.