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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Vydáno: 2004-06-22
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PD ES 59008-5-3:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Vydáno: 2001-12-05
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BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Vydáno: 2016-06-30
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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Vydáno: 2010-10-31
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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BS EN IEC 60749-24:2026
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Vydáno: 2026-01-21
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