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BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Vydáno: 2020-11-03
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2019-05-15
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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Vydáno: 2020-09-09
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BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Vydáno: 2010-07-31
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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Vydáno: 2023-02-02
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24/30506674 DC
BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment
BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment
Vydáno: 2024-12-13
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