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BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-12-20
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Vydáno: 2023-04-05
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24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Vydáno: 2024-04-23
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BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-09
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