PRICES include / exclude VAT
31.080.01 Polovodičové součástky obecně
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
22/30443678 DC
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
Vydáno: 2022-03-30
Anglicky Secure PDF
Immediate download
24.15 €
Anglicky Hardcopy
In stock
24.15 €
BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Vydáno: 2023-05-23
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €
BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-06
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €
BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Vydáno: 2010-04-30
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Vydáno: 2017-11-28
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Vydáno: 2011-07-31
Anglicky Secure PDF
Immediate download
311.59 €
Anglicky Hardcopy
In stock
311.59 €
Anglicky Secure PDF
Immediate download
311.59 €
Anglicky Hardcopy
In stock
311.59 €
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Vydáno: 1990-03-30
Anglicky Secure PDF
Immediate download
398.55 €
Anglicky Hardcopy
In stock
398.55 €
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Vydáno: 2017-11-24
Anglicky Secure PDF
Immediate download
161.84 €
Anglicky Hardcopy
In stock
161.84 €
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Vydáno: 2011-09-30
Anglicky Secure PDF
Immediate download
265.70 €
Anglicky Hardcopy
In stock
265.70 €
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Vydáno: 2008-06-30
Anglicky Secure PDF
Immediate download
190.82 €
Anglicky Hardcopy
In stock
190.82 €